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Touch Profiling on Capacitive-Touch Screens

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专利名称:Touch Profiling on Capacitive-Touch Screens发明人:Chenchi Eric Luo,Milind Borkar申请号:US13559118申请日:20120726

公开号:US20140028605A1公开日:20140130

专利附图:

摘要:An embodiment of the invention provides a method and apparatus for

determining what type of interaction is made with a capacitive touch screen. A capacitancesensor with the largest sensed capacitance in a group of capacitance sensors isdetermined. Next, a parametric surface is determined from the value of the largest

sensed capacitance and the values of the sensed capacitances in the group of capacitancesensors. From the parametric surface, an interpolated peak capacitance, a curvature K atthe interpolated peak and an orientation θ at the interpolated peak are determined.Based on the interpolated peak capacitance, the curvature K and the orientation θ, thetype of interaction made with the capacitive-touch screen is identified.

申请人:Chenchi Eric Luo,Milind Borkar

地址:Atlanta GA US,Dallas TX US

国籍:US,US

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